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Portable spectrophotometer LSP-A10 is adopted with every test calibration ETC technology, where the standard white board is included in the optical system for great accuracy of every measurement. Equipped with automatic gloss compensation technology to ensures the accuracy of the color measurement data for the surface of different gloss. The measurement of the color of the powder, granules & other materials can be done by adding the powder accessories to this spectrophotometer.
Portable spectrophotometer has applications in textile, plastic, food, paint, printing, automobile industries, laboratories & on-site applications for quality control purpose.
| Illumination | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),br/> Maximum:0.03 |
| Sensor | Dual light path sensor array |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05 |
| Sensor | Photoelectric diode sensor |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values:ΔE*ab<=0.02(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.04 |
| Sensor | Photoelectric diode sensor |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination | Observation angles 2°/10° Illumination: d/8 (Diffused lighting, 8° observation angle) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),Maximum:0.04 |
| Sensor | Dual light path sensor array |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | - |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | 60° |
| Optical Geometry | D/8 (diffused illumination,8° viewing), Specular Component Included (SCI) |
| Integrating Sphere Size | Φ 40 mm |
| Light Source | LED (Full band balanced LED) |
| Color Spaces and Indices | Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM),Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength |
| Optical Geometry | D/8 (diffused illumination,8° viewing), SCI (Specular Component Included), SCE (Specular Component Excluded) |
| Integrating Sphere Size | Φ 40 mm |
| Light Source | LED (Full band balanced LED) |
| Color Spaces and Indices | Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM),Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength |
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Integrating Sphere Size | Φ 40 mm |
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Integrating Sphere Size | Φ 40 mm |
Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 nm adjustable |
| Wavelength Accuracy | ± 0.3 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4 nm |
| Wavelength Accuracy | ± 0.1nm (D2, 656.1 nm), ± 0.3 nm full range |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 ~ 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength accuracy | 0.5 nm |
| Wavelength repeatability | ≤ 0.2 nm |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Optical System | Double beam |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.0 nm |
| Optical System | Double beam |
| Wavelength Accuracy | ±0.3 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1.8 nm |
| Optical system | Double beam; 1200 lines/mm grating |
| Wavelength accuracy | ±0.1nm (D2 656.1nm), ±0.3nm @ all |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1.0 to 5.0 nm (adjustable) |
| Optical system | Double beam, C-T monochromator, 1600 L/mm holographic grating |
| Wavelength accuracy | ±0.3 nm |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Optical System | Double beam, C-T monochromator,1200 L/mm holographic grating |
| Wavelength Accuracy | ±0.3 nm |
We produce a wide range of Nano spectrophotometer for qualitative and quantitative analysis of DNA/RNA in the sample. Our product is highly sensitive and requires only 0.5-2µl of sample for analysis.
| Wavelength range | 200 - 800 nm |
| Path length | 0.2 mm (For high concentration measurement); 1.0 mm (For ordinary) |
| Wavelength accuracy | ± 1 nm |
| Wavelength Resolution | ≤ 3 nm (FWHM at Hg 546 nm) |
| Wavelength range | 200 - 850 nm |
| Path length | 1 mm, 2 mm, 5 mm, 10 mm |
| Wavelength accuracy | ± 1 nm |
| Wavelength Resolution | 2 nm (FWHM at Hg 546 nm) |
| Wavelength range | 230 nm, 260 nm, 280 nm |
| Path length | 1.0 mm, 0.2 mm |
| Minimum Sample size | 0.3 - 2.0 µl |
| Absorbance range | 0.2 - 75A (10 mm equivalent absorbance) |
| Cuvette | No |
| PC | Inbuilt |
| Wavelength range | 190 - 850 nm |
| Path length | 1 mm, 0.2 mm ,0.04 mm |
| Cuvette | Yes |
| PC | Inbuilt |
| Wavelength range | 190 - 850 nm |
| Path length | 1 mm, 0.2 mm ,0.04 mm |
| Cuvette | Yes |
| Temperature | Room Temperature 42 ºC |
| PC | Inbuilt |
| Wavelength range | 190 - 850 nm |
| Cuvette | Yes |
| Temperature | 4 ºC - 42 ºC (Heating & Cooling) |
| PC | Inbuilt |
| Wavelength range | 190 - 850 nm |
| Wavelength range | 190 to 850 nm |
| Wavelength accuracy | ± 1 nm |
| Wavelength Resolution | 2 nm (FWHM at Hg 546 nm) |
| Cuvette details | Recyclable micro cuvette, 8.5 mm sample level height |
| Wavelength | 260 nm and 280 nm; Fixed |
| Spectral resolution | ≤ 8 nm |
| Path length | 0.5 mm |
| Minimum sample size | 1 to 2 µl |
We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.3 nm |
| Wavelength Repeatability | 0.2 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Accuracy | ± 0.3 nm |
| Wavelength Repeatability | 0.2 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Accuracy | ± 0.3 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 / 5.0 nm |
| Wavelength Accuracy | ± 0.3 nm |
| Wavelength Repeatability | 0.2 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 0.5 nm, 1 nm, 2 nm, 4 nm adjustable |
| Wavelength Accuracy | ± 0.3 nm |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength Range | 200 to 1000 nm |
| Spectral Bandwidth | 4.0 nm |
| Optical System | Single beam |
| Wavelength Accuracy | ±0.2 nm |
Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.
| Wavelength Range | 330 to 1000 nm |
| Spectral Bandwidth | 5 nm |
| Wavelength Accuracy | ± 2 nm |
| Wavelength Repeatability | ≤ 1.0 nm |
| Wavelength Range | 335 ~ 1000 nm |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ± 2 nm |
| Wavelength Repeatability | 1 nm |
| Wavelength Range | 325 ~ 1000 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 1.0 nm |
| Wavelength Range | 320 ~ 1100 nm |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Wavelength Repeatability | ≤ 0.2 nm |
| Wavelength Range | 320 ~ 1000 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Wavelength Repeatability | ≤ 0.2 nm |
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 340 to 1000nm |
| Spectral bandwidth | 5 nm |
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 325 to 1000nm |
| Spectral bandwidth | 2 nm |
| Wavelength range | 320 to 1100 nm |
| Spectral bandwidth | 2.0 nm |
| Wavelength Accuracy | ± 0.8 nm |
| Wavelength Repeatability | ≤ 0.3 nm |
Labtron Atomic Absorption Spectrophotometer makes use of the modern in technology. It is acquired after thorough research into the desires of the diagnostic community. It has all the power, performance and speed necessitated in today’s modern laboratory.
| Working spectral range | 190 to 900 nm |
| Spectral Bandwith | 0.1, 0.2, 0.4, 1.0 and 2.0 nm |
| Wavelength accuracy | ± 0.15 nm |
| Wavelength repeatability | ≤ 0.04 nm |
| Wavelength range | 190 - 900 nm |
| Spectral Bandwidth | 0.2 nm, 0.4 nm, 0.7 nm, 1.4 nm, 2.4 nm, 5.0 nm |
| Wavelength accuracy | ≤ ± 0.5 nm |
| Wavelength repeatability | ≤ 0.3 nm(single direction) |
| Wavelength range | 180 - 900 nm |
| Spectral Bandwidth | 0, 0.2, 0.4, 1.0, 2.0nm (Automatic setting) |
| Wavelength accuracy | ≤ 0.15 nm |
| Wavelength repeatability | ± 0.1 nm |
| Wavelength range | 180 – 900 nm |
| Spectral Bandwidth | 0 nm, 0.2 nm, 0.4 nm, 1.0 nm, 2.0 nm (5 steps with automatic changeover) |
| Wavelength accuracy | ≤ 0.15 nm |
| Wavelength repeatability | ± 0.1 nm |
| Wavelength range | 180 – 900 nm |
| Spectral Bandwidth | 0.1 nm,0.2 nm,0.4 nm, 1.0 nm, 2.0 nm automatic setting |
| Wavelength accuracy | ≤ 0.15 nm |
| Wavelength repeatability | ± 0.1 nm |
| Wavelength range | 190 nm ~ 900 nm |
| Spectral bandwidth | 0.1 nm, 0.2 nm, 1.0 nm, 2.0 nm |
| Wavelength accuracy | ± 0.25 nm |
| Wavelength repeatability | 0.15 nm |
| Wavelength Range | 400 nm to 700 nm |
| Wavelength Interval | 10 nm |
| Sensor | High sensitivity silicon photodiode |
| Light Source | LED |
| Wavelength Range | 360 nm to 780 nm |
| Wavelength Pitch | 10 nm |
| Sensor | Silicon Photodiode Array |
| Grating Method | Concave Grating |
| Illumination system | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Sensor | Dual light path sensor array |
| Illumination system | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Sensor | Dual light path sensor array |
| Illumination system | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 15.2 cm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Sensor | Dual light path sensor array |
| Illumination system | d/0 (Diffused lighting, 0° observation viewing), SCS optical engine (light splitting and integration system), ETC (every time calibration technology), SCI (specular reflection included)/ SCE (specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Sensor | Dual light path sensor array |
| Wavelength Range | 900 nm to 2500 nm |
| Wavelength Accuracy | ≤ 0.2 |
| Wavelength Reproducibility | ≤ 0.05 |
| Bandwidth | 8 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Excitation Source | 150 W Xenon Lamp |
| Excitation Wavelength | 200 nm to 900 nm |
| Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Emission Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |